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CACarl Zeiss AG

Internship / Master thesis on optical metasurface scatterometry metrology(m/w/x)

Oberkochen
Full-timeInternshipOn-site

Researching and developing metrology software for optical metasurface scatterometry, validating nanostructure reconstruction with SEM/TEM at a global leader in optics. Background in Electromagnetism and optical Metrology or applied mathematics essential. Direct involvement in cutting-edge optical metrology research.

Requirements

  • Background in Electromagnetism and optical Metrology or applied mathematics
  • Enrollment in Bachelor’s or Master's program in relevant subjects
  • Applied knowledge in Python or MATLAB

Tasks

  • Develop and optimize geometrical profile reconstruction of nanostructures
  • Create and consolidate a comprehensive metrology software
  • Integrate simulations within metasurfaces
  • Evaluate metrology uncertainties and error propagation quantitatively
  • Compare optical metrology with techniques like SEM and TEM for validation
  • Document developed algorithms and results

Education

  • Currently in higher education

Languages

  • EnglishBusiness Fluent

Tools & Technologies

  • Python
  • MATLAB
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